| 标题 |
Reliability of fine-pitch through-vias in glass interposers and packages for high-bandwidth computing and communications |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of materials science. Materials in electronics 作者:K. Demir; Vijay Sukumaran; Yoichiro Sato; A. El Amrani; Koushik Ramachandran; et al 出版日期:2018-06-01 |
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(2025-6-4)