| 标题 |
Depth profiles, projected ranges, and secondary ion mass spectrometry relative sensitivity factors for more than 50 elements from hydrogen to uranium implanted into metals |
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| 其它 |
期刊:Surface and Coatings Technology 作者:R.G. Wilson; F.A. Stevie; G.E. Lux; C.L. Kirschbaum; S. Frank; et al 出版日期:1992-04-01 |
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(2025-6-4)