| 标题 |
Saliency-Guided Transformer Attention With Pixel-Level Contrastive Learning for Weakly Supervised Defect Localization |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Industrial Informatics 作者:Dejene M. Sime; Nan Ouyang; Kai Sheng; Getu T. Fellek; Wenkang Wan; et al 出版日期:2026-04-01 |
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(2025-6-4)