| 标题 |
Charge carrier trapping management in Bi3+ and lanthanides doped Li(Sc,Lu)GeO4 for x-ray imaging, anti-counterfeiting, and force recording |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied physics reviews 作者:Tianshuai Lyu; Pieter Dorenbos 出版日期:2024-02-21 |
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(2025-6-4)