| 标题 |
Structural and electrical characterization of thick GaN layers on Si, GaN, and engineered substrates |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Atsunori Tanaka; Woojin Choi; Renjie Chen; Ren Liu; William Mook; et al 出版日期:2018-12-10 |
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(2025-6-4)