| 标题 |
Dielectric reliability and interface trap characterization in MOCVD grown in situ Al2O3 on β-Ga2O3 |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Saurav Roy; Arkka Bhattacharyya; Carl Peterson; Sriram Krishnamoorthy 出版日期:2025-01-03 |
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(2025-6-4)