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0.021-μm 2 High-Density SRAM in Intel 18A RibbonFET Technology With PowerVia Backside Power Delivery |
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期刊:IEEE Journal of Solid-state Circuits 作者:Xiaofei Wang; Gwang Hyeon Baek; Kunal Girish Bannore; Kaushal Pareshbhai Dave; Arash Joushaghani; et al 出版日期:2025-10-27 |
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(2025-6-4)