| 标题 |
Micro-scratch Detection on Wafer Surfaces Based on Strip Convolution and High-resolution Feature Reconstruction |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Semiconductor Manufacturing 作者:Dan Jiang; Songbin Li; Yisheng Sun 出版日期:2026-07-17 |
| 求助人 | |
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(2025-6-4)