Ultra‐thin silicon solar cell: Modelling and characterisation

Abstract An ultra‐thin crystalline silicon solar cell with an active silicon layer of 200 nm has been fabricated and fully characterised electrically (I‐V characteristic, spectral response) and optically (Variable Angle Spectroscopic Ellipsometry). Interference effects were observed in the spectral response of the cell due to multiple reflections from the layers within the cell. A mathematical model was developed to account for the different reflections and transmission within the cell which reproduced excellently the essential features of the experimental spectral response. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)