太阳能电池
材料科学
断裂(地质)
功能(生物学)
复合材料
作者
Eric John Schneller,Andrew M. Gabor,Jason Lincoln,Rob Janoch,Andrew Anselmo,Joseph Walters,Hubert Pascal Seigneur
出处
期刊:Conference record of the ... IEEE Photovoltaic Specialists Conference
[Institute of Electrical and Electronics Engineers]
日期:2017-06-01
卷期号:: 2897-2901
被引量:31
标识
DOI:10.1109/pvsc.2017.8366463
摘要
Cell cracking presents a serious risk for the long term reliability of c-Si photovoltaic modules. Cracks may not initially result in performance loss, but over time performance may degrade as the module experiences stresses in the field such as temperature cycling and snow/wind loading. This performance loss is due to the formation of new cracks with front side loading, propagation of existing cracks, and the opening of existing cracks in which regions of the cell become more electrically isolated. This work utilizes a new tool, the LoadSpot, that allows for I-V performance characterization and electroluminescence imaging of PV modules while under mechanical load. We explore a variety of cell technologies to understand the magnitude of mechanical stress required to induce cell fracture, and assess the impact these cracks have on performance. In addition, we study the use of cyclic loading to open existing cracks. The tests used in this work have potential applications in product development, factory quality control, product evaluations, and optimization of mounting hardware and methods.
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