Improvement of Thermal Dissipation of High-Power Photodiodes
作者
Junwu Bai,Yang Shen,Peng Yao,Dekang Chen,Matthew R. Konkol,Xiangwen Guo,Bingtian Guo,Victoria A. Carey,Joe C. Campbell,Dennis W. Prather
标识
DOI:10.1109/ipc57732.2023.10360750
摘要
An n-down MUTC epitaxial structure is designed to improve thermal dissipation. The thermal performance of n-down devices has been simulated. The n-down devices flip-chip bonded to heat sinks are demonstrated to improve thermal characteristics and presage higher RF output power before thermal failure.