X射线光电子能谱
锐钛矿
谱线
分析化学(期刊)
材料科学
兴奋剂
衍射
外延
氧气
结晶学
化学
核磁共振
纳米技术
物理
光催化
光学
催化作用
有机化学
天文
生物化学
光电子学
色谱法
图层(电子)
作者
Yaoguang Yu,Xiangjun Xing,Liping Xu,Shuxiang Wu,Sai-Rui Li
摘要
The plasma-assisted molecular beam epitaxial anatase TiO2−xNx (x<0.3) films were chosen to investigate the N-derived variation in the x-ray photoelectron spectroscopy (XPS). With increasing nitrogen concentration, the small chemical shift and the shoulder of the main peak emerge in the N 1s, O 1s, or Ti 2p3/2 core level spectra. In combination with the experimental results obtained from x-ray diffraction and atomic force microscopy, the variations in the spectra could be ascribed to the microstructural distortion. This distortion, induced by the N3− substitution for lattice O2−, could slightly decrease the average ionicity of the Ti–O (or N) bonds. In addition, the other N 1s features (at 399.8 and 401.8 eV) and the oxygen vacancy are also discussed. For the N-doped TiO2, this work introduces a correlation between the microstructural properties and the XPS signals.
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