A geometric system for universal use in specifying and measuring retroreflectance is described. This system has been developed by the Subcommittee on Retroreflectance of CIE Committee 2.3 on Properties of Materials and is to be considered for adoption as part of a recommended practice.
PDF的下载单位、IP信息已删除
GingerF
leaolf
浮游
ceeray23
加缪
Zoom
tuanheqi
COSMAO
小青椒
GPTea
YifanWang
yznfly
eric888
Criminology34
Bio
七月流火
wop111
笔记本
不配.
HAL
正己化人
昏睡的蟠桃
laber
菠菜
l玖
zcl
sleepingfish
淡淡的南风
皖公网安备34019202002308
