半导体
光电子学
响应度
材料科学
范德瓦尔斯力
数码产品
电极
钝化
纳米技术
光电探测器
电气工程
化学
图层(电子)
有机化学
分子
工程类
物理化学
作者
Zihao Huang,Zhongtong Luo,Ziwen Deng,Mengmeng Yang,Wei Gao,Jiandong Yao,Yu Zhao,Huafeng Dong,Zhaoqiang Zheng,Jingbo Li
出处
期刊:Small methods
[Wiley]
日期:2023-03-18
卷期号:7 (6): e2201571-e2201571
被引量:15
标识
DOI:10.1002/smtd.202201571
摘要
With the rapid development of two-dimensional semiconductor technology, the inevitable chemical disorder at a typical metal-semiconductor interface has become an increasingly serious problem that degrades the performance of 2D semiconductor optoelectronic devices. Herein, defect-free van der Waals contacts have been achieved by utilizing topological Bi2 Se3 as the electrodes. Such clean and atomically sharp contacts avoid the consumption of photogenerated carriers at the interface, enabling a markedly boosted sensitivity as compared to counterpart devices with directly deposited metal electrodes. Typically, the device with 2D WSe2 channel realizes a high responsivity of 20.5 A W-1 , an excellent detectivity of 2.18 × 1012 Jones, and a fast rise/decay time of 41.66/38.81 ms. Furthermore, high-resolution visible-light imaging capability of the WSe2 device is demonstrated, indicating its promising application prospect in future optoelectronic systems. More inspiringly, the topological electrodes are universally applicable to other 2D semiconductor channels, including WS2 and InSe, suggesting its broad applicability. These results open fascinating opportunities for the development of high-performance electronics and optoelectronics.
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