材料科学
工作职能
原子层沉积
氧化锡
钙钛矿(结构)
吸附
密度泛函理论
化学物理
钙钛矿太阳能电池
化学工程
氧化物
偶极子
锡
氟
真空度
真空沉积
电子
静电学
开尔文探针力显微镜
电子亲和性(数据页)
表面电荷
能量转换效率
单层
纳米技术
价(化学)
热稳定性
电子传输链
分析化学(期刊)
电子转移
量子效率
铁电性
表面改性
氧化铟锡
结合能
氧气
等离子体
物理化学
电荷密度
带隙
彭宁离子阱
作者
Nopporn Rujisamphan,Kay Thi Soe,Ratchadaporn Supruangnet,Thipusa Wongpinij,Waranchit Ruengsrisang,Anusit Kaewprajak,Pisist Kumnorkaew,Joongjai Panpranot,Thidarat Supasai
摘要
ABSTRACT Colloidal tin oxide (c‐SnO x ) is the dominant electron transport layer (ETL) used in efficient n–i–p perovskite solar cells (PSCs), yet intrinsic oxygen‐related vacancies undermine operational stability. Here, we report a fluorinated SnO x electron transport layer (ETL) fabricated by SF 6 plasma‐assisted atomic layer deposition (ALD), in which plasma‐generated fluorine species chemisorb preferentially at oxygen vacancy (O v ) sites. Density functional theory calculations show that F and F − bind at a bridging O v with adsorption energies of −5.66 and −4.95 eV, respectively, whereas neutral SF 6 , SF 5, and SF 4 species bind weakly (−0.04 to −0.45 eV). Bader charge analysis confirms electron transfer from the SnO x surface to the adsorbed fluorine. Experimentally, the fluorination induces a surface dipole that shifts the vacuum level and elevates the work function without altering the intrinsic valence band onset of the F‐containing SnO x . This dipole‐induced vacuum level shift influences the interfacial energetics governing directional charge extraction and suppresses interfacial charge accumulation, which enhances device performance and operational stability. PSCs with SF 6 ‐plasma ALD SnO x achieve a power conversion efficiency of 21.0%, retaining 17.29% after 1400 h without encapsulation and sustaining stable power outputs for nearly 7000 min under continuous tracking. These results demonstrate superior performance and operational stability compared to thermal ALD‐grown SnO x without fluorination. The results establish plasma‐enabled interfacial fluorination as a strategy to engineer surface electrostatics and enhance the long‐term stability in perovskite photovoltaics.
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