微分干涉显微术
光学
显微镜
光学显微镜
干涉显微镜
相位对比成像
材料科学
强度(物理)
振幅
差分相位
光路
对比度(视觉)
相衬显微术
相(物质)
干扰(通信)
空间频率
物理
计算机科学
电信
扫描电子显微镜
量子力学
频道(广播)
作者
Shan Shan Kou,Laura Waller,George Barbastathis,Colin J. R. Sheppard
出处
期刊:Optics Letters
[The Optical Society]
日期:2010-01-29
卷期号:35 (3): 447-447
被引量:147
摘要
Differential interference contrast (DIC) microscopy is an inherently qualitative phase-imaging technique. What is obtained is an image with mixed phase-gradient and amplitude information rather than a true linear mapping of actual optical path length (OPL) differences. Here we investigate an approach that combines the transport-of-intensity equation (TIE) with DIC microscopy, thus improving direct visual observation. There is little hardware modification and the computation is noniterative. Numerically solving for the propagation of light in a series of through-focus DIC images allows linear phase information in a single slice to be completely determined and restored from DIC intensity values.
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