肖特基势垒
接口(物质)
数码产品
晶体管
接触电阻
纳米技术
范德瓦尔斯力
材料科学
单层
半导体
硅
肖特基二极管
工程物理
电接点
GSM演进的增强数据速率
分子电子学
纳米电子学
半导体器件
光电子学
场效应晶体管
电子工程
柔性电子器件
计算机科学
集成电路
可靠性(半导体)
频道(广播)
MOSFET
石墨烯
电气工程
作者
Sangyeon Pak,John Hong,SeungNam Cha
出处
期刊:ACS Nano
[American Chemical Society]
日期:2025-09-23
卷期号:19 (39): 34449-34468
被引量:3
标识
DOI:10.1021/acsnano.5c07026
摘要
Two-dimensional (2D) semiconductors such as monolayer MoS2 and WSe2 have rapidly gained attention as next-generation channel materials for ultrascaled electronics owing to their exceptional electrostatic control and atomic-scale thickness. Despite their promise, the high contact resistance and Fermi-level pinning at the metal-semiconductor interface continue to hinder optimal device performance and scalability. This review highlights recent breakthroughs in contact engineering─including van der Waals metal transfer, semimetallic and edge contacts, contact doping, strain engineering, and self-healing electrodes─that collectively enhance carrier injection, reduce Schottky barriers, and improve interface stability. We also examine complementary metal-oxide semiconductor-compatible integration strategies and the growing role of computational screening and machine learning in accelerating the discovery of optimal contact materials. These advances have enabled record-setting 2D field-effect transistor performance at sub-50 nm gate lengths, underscoring the increasing readiness of 2D materials for high-volume, energy-efficient applications beyond the silicon era.
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