拉曼散射
薄脆饼
材料科学
纳米线
蚀刻(微加工)
各向同性腐蚀
溅射
检出限
硅
纳米技术
拉曼光谱
纳米颗粒
涂层
光电子学
分析化学(期刊)
薄膜
光学
化学
图层(电子)
色谱法
物理
作者
Nguyen Duy Thien,Le Van Vu,Nguyen Quang Hoa,Sai Cong Doanh,Vuong Van Hiep,Nguyễn Năng Định,Pham Nguyen Hai,Le Quang Thao,Nguyễn Năng Định,Nam Nhat Hoang
标识
DOI:10.1016/j.omx.2023.100250
摘要
In this study, we present an efficient method based on vertically oriented silicon nanowire arrays coated with silver nanoparticles to achieve significantly surface enhanced Raman scattering (SERS) signals. The method is applicable for the accurate detection of fungicides and related compounds. The substrates were obtained by a two-step process consisting of the growth of Si nanowire arrays on a silicon wafer by metal-assisted chemical etching and subsequent coating with Ag nanoparticles by the sputtering method. The effect of sputtering time on the growth of nanowires, their morphology and enhancement factor of the signals obtained from the SERS sensor were studied in detail. The final enhancement factor of Raman shift is 1.1 × 107, allowing the limit of trace detection for carbendazim to be as low as 0.1 ppm, with a relative standard deviation of less than 2.07%. This result opens up the potential for direct application of prepared substrates in ultra-fast chemical analysis.
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