铁电性
非易失性存储器
材料科学
电介质
化学气相沉积
光电子学
晶体管
场效应晶体管
电气工程
纳米技术
计算机科学
电压
工程类
作者
Chunyang Li,Lu Li,Zhong‐Yi Li,Fanqing Zhang,Lixin Dong,Jing Zhao
出处
期刊:
日期:2022-08-08
卷期号:: 247-251
标识
DOI:10.1109/3m-nano56083.2022.9941686
摘要
Ferroelectric field effect transistor (FeFET) based on two-dimensional (2D) materials is centered great expectations for next-generation non-volatile memory devices owing to its excellent properties. In this paper, we fabricated monolayer $\text{MoS}_{2}$ FeFET devices array through coupling ferroelectric P(VDF - TrFE) as the dielectric layer. The $\text{MoS}_{2}$ FeFET device demonstrated excellent storage performance, including high on/off current ratios $\boldsymbol{(> 10^{6})}$ , a broad memory window (~15 V), long endurance (>200 cycles), and retention time (>1000 s). In additional, attributed to the chemical vapor deposition (CVD) synthesis of large-scale uniform Mos2,the devices array shows consistent characteristics, which suggest huge potential integrated circuit applications in the future.
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