响应度
雪崩光电二极管
光电子学
光电二极管
材料科学
暗电流
波导管
光学
雪崩二极管
硅
单光子雪崩二极管
击穿电压
光电探测器
物理
探测器
电压
量子力学
作者
Shiyang Zhu,Kah‐Wee Ang,S.C. Rustagi,J. Wang,Yujie Xiong,G. Q. Lo,Dim‐Lee Kwong
标识
DOI:10.1109/led.2009.2025782
摘要
A novel Si-waveguide-integrated Ge/Si avalanche photodiode (APD) is demonstrated for the first time, in which light propagating along the Si waveguide is evanescently absorbed by an overlaying Ge layer selectively grown on it, whereas the avalanche multiplication of photoexcited carriers occurs laterally in the Si-waveguide layer. The APD provides a responsivity of ~7.2 A/W at 1550 nm, which is ~26 times larger than the corresponding vertical Ge/Si p-i-n photodiode, and exhibits a 3-dB bandwidth of ~3.3 GHz, a dark current of ~22 ¿A at 22-V bias, and an excess noise factor of ~4, respectively.
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