范德瓦尔斯力
带偏移量
偶极子
电荷(物理)
密度泛函理论
异质结
材料科学
半导体
能量(信号处理)
电子能带结构
统计物理学
量子
电容
偏移量(计算机科学)
凝聚态物理
物理
卡西米尔效应
静电学
电荷密度
电子结构
计算物理学
参数统计
激子
势能
替代模型
电子
量子力学
作者
Seungjun Lee,Eng Hock Lee,Young‐Kyun Kwon,Steven J. Koester,Phaedon Avouris,Vladimir Cherkassky,J. Tersoff,Tony Low
出处
期刊:ACS Nano
[American Chemical Society]
日期:2025-10-22
卷期号:19 (43): 37749-37757
标识
DOI:10.1021/acsnano.5c10603
摘要
The energy band alignment at the interface of van der Waals heterostructures (vdWHs) is a key design parameter for next-generation electronic and optoelectronic devices. Although the Anderson and midgap models have been widely adopted for bulk semiconductor heterostructures, they exhibit severe limitations when applied to vdWHs, particularly for type-III systems. Based on first-principles calculations for approximately 103 vdWHs, we demonstrate that these traditional models miss a critical dipole arising from interlayer charge spillage. We introduce a generalized linear response (gLR) model that includes this dipole through a quantum capacitance term while remaining analytically compact. With only two readily computed inputs, the charge neutrality level offset and the sum of the isolated-layer bandgaps, the gLR reproduces density functional theory (DFT) band line-ups with r2 ∼ 0.9 across type-I, -II, and -III stacks. Machine learning feature analysis confirms that these two descriptors dominate the underlying physics, indicating that the model is near-minimal and broadly transferable. The gLR framework therefore provides both mechanistic insight and a fast and accurate surrogate for high-throughput screening of the vast vdW heterostructure design space.
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