RF transceiver front-end design for testability

In this thesis, we analyze the performance of a loop-back built-in-self-test for a RF transceiver front-end. The tests aim at spot defects in a transceiver front-end and they make use of RF specifications such as NF (Noise Figure), G (power gain) and IIP3 (third order Intercept point). To enhance fault detectability, RF signal path sensitization is introduced. We use a functional RF transceiver model that is implemented in MatLab™ to verify this analysis.