PCB Reliability Assessment Based on Accelerated Performance Degradation Testing

The traditional reliability assessment methods are based on failure lifetime data.However,for high reliability and long lifetime products,it is very difficult to obtain their failure lifetime data through life test and accelerated life test.Degradation data can provide with useful information about the reliability assessment for these products.For these questions,a new good method is presented based on failure data's reliability assessment and accelerated performance degradation testing.Finally,this paper gives one case of accelerated performance degradation testing of 24V/2A power supply board of steady voltage to prove the method.And the results demonstrate that this method is correct and valid for reliability assessment of high reliability and long life electronic equipments.