德拉姆
计算机科学
可靠性(半导体)
带宽(计算)
电源完整性
信号完整性
嵌入式系统
计算机硬件
功率(物理)
计算机网络
互连
量子力学
物理
作者
Jin Hee Cho,Jihwan Kim,Woo Young Lee,Dong Uk Lee,Tae Kyun Kim,Heat Bit Park,Chunseok Jeong,Myeong-Jae Park,Seung Geun Baek,Seok-Woo Choi,Byung-Kuk Yoon,Young Jae Choi,Kyo Yun Lee,Daeyong Shim,Jonghoon Oh,Jinkook Kim,Seok‐Hee Lee
出处
期刊:Digest of technical papers
[Institute of Electrical and Electronics Engineers]
日期:2018-02-01
卷期号:: 208-210
被引量:62
标识
DOI:10.1109/isscc.2018.8310257
摘要
With the recent increasing interest in big data and artificial intelligence, there is an emerging demand for high-performance memory system with large density and high data-bandwidth. However, conventional DIMM-type memory has difficulty achieving more than 50GB/s due to its limited pin count and signal integrity issues. High-bandwidth memory (HBM) DRAM, with TSV technology and wide IOs, is a prominent solution to this problem, but it still has many limitations: including power consumption and reliability. This paper presents a power-efficient structure of TSVs with reliability and a cost-effective HBM DRAM core architecture.
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