可靠性(半导体)
蒙特卡罗方法
伽马过程
随机过程
可靠性工程
自相关
过程(计算)
动态称重
随机建模
计算机科学
工程类
结构工程
数学
统计
量子力学
操作系统
物理
轴
功率(物理)
作者
Yaotian Zhang,Quanwang Li,Hao Zhang
标识
DOI:10.1080/15732479.2023.2169469
摘要
Structural resistance deterioration is by nature a non-increasing stochastic process with autocorrelation on the temporal scale. The Gamma process is often used to describe the stochastic behavior of resistance deterioration. With Gamma-based deterioration models, the calculation of time-dependent reliability presents a serious challenge, and often Monte Carlo simulation is the only solution to this problem. This paper derives a closed-form solution for time-dependent reliability of aging structures, in which the resistance deterioration is described by a Gamma process and the applied load is modelled as a Gaussian process with a constant standard deviation. The accuracy of the proposed method is verified through a comparison with Monte Carlo simulation results, and its applicability is further illustrated in a time-dependent reliability analysis of an existing highway bridge whose vehicle load is modelled using weigh-in-motion (WIM) data. It is found that the measured vehicle load has a relatively small uncertainty, and the uncertainty associated with resistance deterioration is crucial to the reliability assessment because it dominates the overall uncertainty in the reliability calculation.
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