薄脆饼
材料科学
制作
晶片键合
粘结强度
复合材料
粘结强度
光电子学
阳极连接
声表面波
曲面(拓扑)
梁(结构)
离子束
碳化硅
晶圆制造
电子工程
表面改性
离子
聚焦离子束
作者
Kosei Matsunobu,Ryo Takigawa
标识
DOI:10.35848/1347-4065/adbdd6
摘要
Abstract We have been developing a modified surface activated bonding (SAB) method as an alternative approach to the conventional SAB method. The modified SAB method with ion beam bombardment was used to achieve quasi-direct bonding of LiNbO 3 and SiC wafers at room temperature. The measured bond strength was greater than 20 MPa, which is sufficient to endure the post-bonding processes for device fabrication, and the effectiveness of the proposed method when compared to the conventional SAB method was experimentally verified. The results provide evidence that LiNbO 3 and SiC wafers can be strongly bonded at room temperature and demonstrate the potential for the future fabrication of heterogeneous LiNbO 3 /SiC devices including temperature-compensated and heat-dissipated surface acoustic wave filters.
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