摩擦电效应
纳米发生器
材料科学
接触带电
电介质
光电子学
纳米尺度
电荷密度
静电感应
扫描电子显微镜
导电原子力显微镜
光导原子力显微镜
电极
纳米技术
表面电荷
静电力显微镜
扫描电容显微镜
化学
复合材料
原子力显微镜
扫描共焦电子显微镜
物理
压电
物理化学
量子力学
作者
Shiquan Lin,Zhong Lin Wang
摘要
Inspired by the contact-separation mode triboelectric nanogenerator (TENG), we propose a technique for local surface charge density measurement based on atomic force microscopy. It is named as scanning TENG, in which a conductive tip tapping above a charged dielectric surface produces an AC between the tip and the dielectric bottom electrode due to electrostatic induction. The Fourier analysis shows that the amplitude of the first harmonic of the AC is linearly related to surface charge density. The results demonstrate that the scanning TENG is a powerful tool for probing nanoscale charge transfer in contact-electrification.
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