Reliable and Robust Two-Dimensional Perovskite Memristors for Flexible-Resistive Random-Access Memory Array

Two-dimensional (2D) halide perovskites have become a promising class of memristive materials due to their low power consumption, compositional versatility, and microstructural anisotropy in electronics. However, implementing high-performance resistive random-access memory requires a higher reliability and moisture resistance. To address these issues, component studies and attempts to improve the phase stability have been reported but have not been able to achieve sufficient reliability. Here, highly textured thin films grown perpendicular to the substrate in Ruddlesden-Popper 2D perovskites exhibited highly stable and reliable binary memory performance. We further built a flexible crossbar array to verify data storage capability, achieving a high device yield, robust endurance, long retention, reliability to operate under bending conditions, and moisture stability over a year. These device performances are attributed to preformed vertically oriented nanocrystals that allow the conductive filaments to operate reliably. Our finding provides the material design strategy that can be extended to the development of semiconductor materials for next-generation memory devices.