检出限
氢氧化钾
氢氧化钠
感应耦合等离子体
等离子体原子发射光谱
花卉栽培
化学
分析化学(期刊)
材料科学
色谱法
园艺
等离子体
生物
有机化学
物理化学
物理
量子力学
作者
Jonathan M. Frantz,James Locke,L. E. Datnoff,M. A. Omer,A. Widrig,Douglas Sturtz,Leona Horst,C. R. Krause
标识
DOI:10.1080/00103620802358912
摘要
Silicon (Si) detection, distribution, and quantification in plants was compared using electron beam analysis (EBA; scanning electron microscopy coupled with energy dispersive X‐ray analysis), colorimetric analysis, and inductively coupled plasma–optical emission spectroscopy (ICP‐OES) in 14 economically important floriculture species. Using EBA, Si was identified most commonly around the base of trichomes and along the leaf margins. The ICP‐OES processing and analysis for Si using sodium hydroxide (NaOH) resulted in damaged torches and microwavable Teflon® vessels that required expensive replacement at the end of each run, but this was not the case in the colorimetric method or with a potassium hydroxide (KOH)–based matrix in the ICP‐OES. The results of these analyses suggest there is agreement between quantification methods, and EBA has a lower detection limit of about 300 mg kg−1 dry weight of Si. Several new floriculture species (zinnia, impatiens, verbena, and calibrachoa) were identified that take up and accumulate Si in significant concentrations.
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