材料科学
钼
激光器
激光烧蚀
难熔金属
基质(水族馆)
蚀刻(微加工)
薄膜
光电子学
光学
纳米技术
冶金
海洋学
物理
地质学
图层(电子)
作者
С. Д. Полетаев,S. Volotovsky
出处
期刊:Computer Optics
[Samara National Research University]
日期:2016-01-01
卷期号:40 (3): 422-426
被引量:1
标识
DOI:10.18287/2412-6179-2016-40-3-422-426
摘要
We discuss a problem of reducing the thickness of lines of the contact pattern masks produced by laser ablation of thin films of refractory metals and used when synthesizing the micro-relief of diffractive optical elements (DOEs). For a contact mask for a DOE on molybdenum, patterns with features in the range 0.25-0.3 µm were recorder by laser ablation on 40-nm thick films. This is approximately 3 times smaller than the characteristic dimensions obtained by thermochemical recording chromium films of the same thickness in the standard process. A microrelief of height of up to 300 nm was formed in a quartz substrate by reactive ion etching in an inductively coupled plasma through the mask. We show that thin molybdenum films can have promising applications as metallic masks when synthesizing a DOE microrelief.
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