中子衍射
材料科学
衍射仪
结构精修
粉末衍射仪
纹理(宇宙学)
电子背散射衍射
衍射
中子
方向(向量空间)
粉末衍射
光学
结晶学
物理
计算机科学
扫描电子显微镜
核物理学
化学
几何学
数学
人工智能
复合材料
图像(数学)
作者
Hans‐Rudolf Wenk,Luca Lutterotti,Sven C. Vogel
出处
期刊:Powder Diffraction
[Cambridge University Press]
日期:2010-09-01
卷期号:25 (3): 283-296
被引量:161
摘要
One of the advantages of a multidetector neutron time-of-flight diffractometer such as the high pressure preferred orientation diffractometer (HIPPO) at the Los Alamos Neutron Science Center is the capability to measure efficiently preferred orientation of bulk materials. A routine experimental method for measurements, both at ambient conditions, as well as high or low temperatures, has been established. However, only recently has the complex data analysis been streamlined to make it straightforward for a noninitiated user. Here, we describe the Rietveld texture analysis of HIPPO data with the computer code Materials Analysis Using Diffraction ( MAUD ) as a step-by-step procedure and illustrate it with a metamorphic quartz rock. Postprocessing of the results is described and neutron diffraction results are compared with electron backscatter diffraction measurements on the same sample.
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