摘要
Abstract X‐ray absorption Cu K‐edge spectra are recorded in some Cu(II) compounds. La 2 CuO 4 , CuSO 4 · 5 H 2 O, CuCO 3 · Cu(OH) 2 , CuWO 4 , (NH 4 ) 2 SO 4 · CuSO 4 · 6 H 2 O, and Cu(OH) 2 and also there of pure Cu metal using a Cauchois‐type bent‐crystal X‐ray spectrograph. The X‐ray absorption chemical‐shift, Δ E , in each of the above Cu(II) compounds is measured. The chemical‐shift, Δ E , is correlated separately with each of its two governing factors, the effective charge, q , and the bond length, R , in the systems under study on the basis of the least‐squares regression analysis. Also the extent is determined to which the chemical‐shift, Δ E , is explained by each of the two factors, the effective charge, q , and the bond length, R , separately. It is also shown that the chemical‐shift, Δ E , prominently depends on the effective charge, q , and the bond length, R , i.e. q and R explain almost the total variation in chemical‐shift, Δ E , in the systems under study.