制作
沟槽
蚀刻(微加工)
沟槽(工程)
材料科学
光电子学
MESFET
MOSFET
干法蚀刻
晶体管
场效应晶体管
阈值电压
电气工程
纳米技术
电压
工程类
图层(电子)
冶金
病理
替代医学
医学
作者
Yidi Yin,Joseph Pinchbeck,Colm O’Regan,Ivor Guiney,D. J. Wallis,Kean Boon Lee
标识
DOI:10.1109/led.2022.3203633
摘要
In this letter, we report the fabrication of an enhancement-mode V-groove metal oxide semiconductor field-effect transistor on semi-polar (11-22) GaN platform. A wet crystallographic hydroxide-based etching approach to achieve a vertical inversion trench sidewall is utilized. This novel fabrication method enables the formation of the vertical trench sidewall channel conduction without the need for a conventional chlorine-based dry etching. The fabricated VMOSFET exhibit a threshold voltage of 9.49 V, a current ON/OFF ratio of >10 7 , an ON-state resistance of 8.0 mΩ.cm 2 , and an output current of 516 A/cm 2 .
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