X射线光电子能谱
钝化
合金
材料科学
腐蚀
氧化物
极化(电化学)
硫酸
冶金
分析化学(期刊)
图层(电子)
化学工程
复合材料
化学
物理化学
色谱法
工程类
作者
Luntao Wang,Dimitri Mercier,Sandrine Zanna,Antoine Seyeux,Mathilde Laurent‐Brocq,Loïc Perrière,Ivan Guillot,Philippe Marcus
标识
DOI:10.1016/j.corsci.2020.108507
摘要
XPS and ToF-SIMS analysis have been combined with electrochemical measurements to determine the corrosion behavior of the equiatomic CoCrFeMnNi high entropy alloy. An XPS methodology based on analysis of the 3p core level spectra was developed to determine the composition and thickness of oxide films. Both native oxide (∼1.4 nm) and passive films (∼ 1.6 nm) formed in acidic medium are duplex, comprising Cr and Mn inner layer and Cr/Fe/Co mixture outer layer. No nickel is observed in the oxide layer. The effects of exposure of the native film to sulfuric acid and passivation under anodic polarization have been investigated.
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