二硒化钨
材料科学
异质结
双极扩散
带偏移量
二硫化钨
范德瓦尔斯力
半导体
量子隧道
纳米技术
带隙
二硫化钼
光电子学
电子能带结构
过渡金属
凝聚态物理
价带
电子
复合材料
物理
生物化学
化学
有机化学
量子力学
分子
催化作用
作者
June‐Chul Shin,Yeon Ho Kim,Kenji Watanabe,Takashi Taniguchi,Chul‐Ho Lee,Gwan‐Hyoung Lee
标识
DOI:10.1002/admi.202101763
摘要
Abstract Transition metal dichalcogenides (TMDs), one of the 2D semiconductors, such as molybdenum disulfide (MoS 2 ) and tungsten diselenide (WSe 2 ), exhibit novel physical and electronic properties that are useful for electronic and optoelectronic applications. Recently, the van der Waals heterostructures consisting of different 2D materials have been studied actively as various combinations of 2D materials can be fabricated with exceptional performance and physical properties. Nevertheless, study on homo‐junction of the same TMDs layers is lacking. Here, it is demonstrated that a vertical homo‐junction consisting of two WSe 2 flakes with different thicknesses shows anti‐ambipolar transport behavior due to a thickness‐induced band offset at the interface. Photo‐response current is generated by tunneling‐mediated interlayer recombination at the WSe 2 homo‐junction. The band structures of homo‐junctions of TMDs can be engineered by the thickness, which would be beneficial for understanding transport at the interfaces of 2D materials and developing the next generation devices.
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