二硒化钨
单层
材料科学
半导体
蒸发
二硫化钨
成核
金属
光电子学
二硫化钼
铋
纳米技术
外延
范德瓦尔斯力
钨
钯
晶体管
钼
石墨烯
锗
热的
砷化镓
过渡金属
场效应晶体管
钨化合物
异质结
作者
Ying Zhang,Chang Liu,Huiting Wang,Guichen Teng,Yilu Qin,Wencheng Niu,Shuimei Ding,Binmin Wu,Shuaiqin Wu,Yan Chen,Ni Yang,Tie Lin,Hong Shen,Xiangjian Meng,Yuan Liu,Xuming Zou,Xudong Wang,Lei Liao,Junhao Chu,Lain‐Jong Li
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2026-08-27
卷期号:393 (6814): 938-943
被引量:2
标识
DOI:10.1126/science.aee3132
摘要
Metal contacts remain one of the key bottlenecks in two-dimensional (2D) semiconductor electronics. We developed an atomic-scale step-by-step evaporation method to directly grow single-crystal metals on monolayer semiconductors with clean interfaces. This method accesses a distinct growth-kinetic window that suppresses secondary nucleation and promotes lateral coalescence, enabling van der Waals epitaxy of diverse metals—including bismuth, silver, indium, gold, and palladium—on molybdenum disulfide (MoS 2 ) and tungsten diselenide (WSe 2 ). The single-crystal metals support ultrathin conduction, provide spatially uniform work functions, and exhibit improved thermal robustness. As contacts, they show minimal Fermi-level pinning, approaching the Schottky–Mott limit. With bismuth and palladium contacts, monolayer MoS 2 and WSe 2 transistors achieved ultralow n- and p-type contact resistances of 36 and 145 ohm-micrometers, respectively, and short-channel currents both above 1.1 milliampere per micrometer.
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