扩散
反向
焊剂(冶金)
电子
降级(电信)
分析化学(期刊)
辐照
物理
等效串联电阻
抗辐射性
辐射
材料科学
化学
原子物理学
光学
数学
计算机科学
核物理学
电信
热力学
色谱法
量子力学
电压
冶金
几何学
作者
W. Rosenzweig,H.K. Gummel,F. M. Smits
标识
DOI:10.1002/j.1538-7305.1963.tb00506.x
摘要
The effect of radiation damage on the important parameters of solar cells has been evaluated for groups of blue-sensitive n-on-p, normal p-on-n, and blue-sensitive p-on-n cells using 1-Mev electrons. The outer space short circuit current, maximum power, junction characteristic, and spectral response are presented quantitatively as a function of radiation flux along with the bulk minority-carrier diffusion length. The rate of change of inverse squared diffusion length with flux is found to be 1.22 × 10 −8 for the p-on-n cells, as compared to 1.7 × 10 −10 for the n-on-p. The degradation of the spectral response is consistent with the measured diffusion length for both types of cells if one assumes a total effective front layer of 1 μ thickness for the p-on-n cells. As a result of the less rapid degradation of their minority-carrier lifetime, the n-on-p cells exhibit a greater resistance to radiation than the p-on-n cells. Comparing only the two types of blue-sensitive cells, after prolonged bombardment, the flux ratios required to achieve equal values of short-circuit current and maximum power are 17 and 9.5 respectively.
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