Measuring twin dependent triple junctions from a single section plane

Given that polycrystalline triple junctions are significant contributors to material properties, they are frequently becoming the focus of emerging research. Despite this interest, the tools to quickly and quantitatively analyze triple junction textures remain severely limited. To enable characterization of triple junctions on a large scale, the parameters, space, and conventions of twin dependent triple junction distributions have been developed. In addition, by adopting grain boundary stereological techniques, triple junction distributions have been generated from a single section plane for triple junctions containing a coherent twin boundary. This methodology has been validated using simulated microstructures and, with further experimental development, will provide insight into actual triple junction structures. This technique also establishes the foundation for a generalized non-twin dependent approach in the future.