光电探测器
铁电性
材料科学
光电子学
电介质
硒化物
带隙
电子迁移率
极化(电化学)
化学
物理化学
冶金
硒
作者
Li Liu,Liangmei Wu,Aiwei Wang,Hongtao Liu,Ruisong Ma,Kang Wu,Jiancui Chen,Zhang Zhou,Yuan Tian,Haitao Yang,Chengmin Shen,Lihong Bao,Zhihui Qin,Sokrates T. Pantelides,Hong‐Jun Gao
出处
期刊:Nano Letters
[American Chemical Society]
日期:2020-08-21
卷期号:20 (9): 6666-6673
被引量:91
标识
DOI:10.1021/acs.nanolett.0c02448
摘要
Indium selenide (InSe) has a high electron mobility and tunable direct band gap, enabling its potential applications to electronic and optoelectronic devices. Here, we report the fabrication of InSe photodetectors with high on/off ratios and ultrahigh photoresponsivity, using ferroelectric poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) copolymer films as the top-gate dielectric. Benefiting from the successful suppression of the dark current down to ∼10-14A in the InSe channel by tuning the three different polarization states in ferroelectric P(VDF-TrFE) and improved interface properties using h-BN as a substrate, the ferroelectric-gated InSe photodetectors show a high on/off ratio of over 108, a high photoresponsivity up to 14 250 AW-1, a high detectivity up to 1.63 × 1013 Jones, and a fast response time of 600 μs even at zero-gate voltage. The present results highlight the role of ferroelectric P(VDF-TrFE) in tuning the carrier transport of InSe and may provide an avenue for the development of InSe-based photodetectors.
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