DUT Board Design Considerations for HV Application Reliability Testing of WBG Power Devices

This paper discusses design considerations of the printed circuit boards that carry WBG power devices for multi-channel HV application reliability tests. Different DUT board concepts are discussed regarding electrical and mechanical considerations as well as cooling strategies. All presented boards provide solutions for in-situ monitoring or intermittent static readouts of relevant device parameters. In the conclusion, a comparison of all main design properties is presented.