开尔文探针力显微镜
钙钛矿(结构)
材料科学
工作职能
伏打电位
纳米技术
显微镜
纳米尺度
光电子学
原子力显微镜
光学
化学
物理
结晶学
图层(电子)
作者
Zhuo Kang,Haonan Si,Mingyue Shi,Chenzhe Xu,Wenqiang Fan,Shuangfei Ma,Ammarah Kausar,Qingliang Liao,Zheng Zhang,Yue Zhang
标识
DOI:10.1007/s40843-018-9395-y
摘要
Kelvin probe force microscopy (KPFM) could identify the local work function of surface at nanoscale with high-resolution on the basis of simultaneous visualization of surface topography, which provides a unique route to in-situ study of the surface information like the composition and electronic states. Currently, as a non-destructive detection protocol, KPFM demonstrates the unique potential to probe the basic nature of perovskite materials that is extremely sensitive to water, oxygen and electron beam irradiation. This paper systematically introduces the fundamentals and working mode of KPFM, and elaborates the promising applications in perovskite solar cells for energy band structures and carrier transport dynamics, trap states, crystal phases, as well as ion migration explorations. The comprehensive understanding of such potential detection engineering may provide novel and effective approaches for unraveling the unique properties of perovskite solar cells.
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