Development of device for measuring thermoelectric materials' Seebeck coefficient

In order to inhibit the oxidation of thermoelectric materials during the test at high temperature, a new device is designed for the measurement of Seebeck coefficient on the conditions of vacuum and high temperature based on the Seebeck effect. This device mainly includes vacuum system, sample support and integrated control system. The device is low cost and convenient to operate. Using this new device,the oxidation of thermoelectric materials during the high temperature test can be effectively avoided, and the Seebeck coefficient can be measured accurately and quickly.