Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Hongxuan Guo, Jianhua Gao, Nobuyuki Ishida, Mingsheng Xu, Daisuke Fujita; Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy. Appl. Phys. Lett. 20 January 2014; 104 (3): 031607. https://doi.org/10.1063/1.4862819 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search