介电谱
化学
扫描电化学显微镜
电化学
显微镜
石墨烯
纳米技术
分析化学(期刊)
电极
光学
材料科学
色谱法
物理
物理化学
作者
Lei Cheng,Rong Jin,Dechen Jiang,Jian Zhuang,Xiuwu Liao,Qiangqiang Zheng
出处
期刊:Analytical Chemistry
[American Chemical Society]
日期:2021-11-29
卷期号:93 (49): 16401-16408
被引量:15
标识
DOI:10.1021/acs.analchem.1c02972
摘要
Local electrochemical impedance spectroscopy (LEIS) has been a versatile technology for characterizing local complex electrochemical processes at heterogeneous surfaces. However, further application of this technology is restricted by its poor spatial resolution. In this work, high-spatial-resolution LEIS was realized using scanning electrochemical cell microscopy (SECCM-LEIS). The spatial resolution was proven to be ∼180 nm based on experimental and simulation results. The stability and reliability of this platform were further verified by long-term tests and Kramers-Kronig transformation. With this technology, larger electric double-layer capacitance (Cdl) and smaller interfacial resistance (Rt) were observed at the edges of N-doped reduced graphene oxide, as compared to those at the planar surface, which may be due to the high electrochemical activity at the edges. The established SECCM-LEIS provides a high-spatial approach for study of the interfacial electrochemical behavior of materials, which can contribute to the elucidation of the electrochemical reaction mechanism at material surfaces.
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