| 标题 |
Sidewall passivation during the etching of poly-Si in an electron cyclotron resonance plasma of HBr |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 作者:M. Haverlag; G. S. Oehrlein; D. Vender 出版日期:1994-01-01 |
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(2025-6-4)