| 标题 |
Electrical Performance and Hot-Carrier Reliability Co-Optimization in Fabricated Triple RESURF LDMOS |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:Yixian Song; Xiaoyun Huang; Yiting Ye; Yaoting Wang; Zenan Wang; et al 出版日期:2026-01-01 |
| 求助人 | |
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(2025-6-4)