| 标题 |
Interface and Border Traps in the Gate Stack of Carbon Nanotube Film Transistors with an Yttria Dielectric |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS applied electronic materials 作者:Hongshan Xiao; Yifan Liu; Sujuan Ding; Yunfei Gao; Minglong Zhai; et al 出版日期:2023-07-10 |
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(2025-6-4)