| 标题 |
Effects of Deep Level Defect Variations on Ga2O3/SiC Heterojunction Diodes Due to Post-Annealing Atmosphere |
| 网址 | |
| DOI |
10.7471/ikeee.2024.28.1.104
doi
|
| 其它 |
期刊:Journal of IKEEE 作者:Seung-Hwan Chung; Myeoung-Chul Shin; Mathieu Jarry; Sang-Mo Koo 出版日期:2024-03-31 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)