| 标题 |
Quantified density of performance-degrading near-interface traps in SiC MOSFETs |
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| DOI | |
| 其它 |
期刊:Scientific Reports 作者:Mayank Chaturvedi; Sima Dimitrijev; Daniel Haasmann; Hamid Amini Moghadam; Peyush Pande; et al 出版日期:2022-03-08 |
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(2025-6-4)