| 标题 |
Investigation of interfacial charge-carrier dynamics, degradation, and recombination mechanisms in single-junction perovskite solar cells with NiO x and SAM hole-transporting layers via steady-state drift-diffusion model simulations |
| 网址 | |
| DOI | |
| 其它 |
期刊:Sustainable Energy and Fuels 作者:Ivona Kafedjiska; Vincent M. Le Corre; Hans Köbler; Igal Levine; Rutger Schlatmann; et al 出版日期:2026-01-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)